Microstructure-Property Correlations for Hard, Superhard, and Ultrahard Materials by Valentine Kanyanta

Author:Valentine Kanyanta
Language: eng
Format: epub
Publisher: Springer International Publishing, Cham

E (GPa)

B (GPa)

G (GPa)

445 ± 20

295 ± 15

195 ±15

Ultrasonic interferometry can be used for the determination of second-order elastic constant of bulk samples from which elastic moduli B and G can be calculated using the well-known formulae (see review by Jacobsen et al. 2005). Thus, also the Poisson’s ratio and Young’s modulus can be obtained. The recent development of this technique into the gigahertz range allowed one to measure elastic moduli with high precision of about 0.1 and 1 % for samples of 1 and 0.1 mm size, respectively (Chang et al. 2014). The measurements can also be done on samples placed in diamond culets and exposed to high pressure. As far as we know, this method has not been used so far for measurement of elastic properties of thin films on a substrate. Most probably, the usually small thickness of the coatings and the presence of the substrate will make it difficult.

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